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Strain and Ge concentration determinations in SiGe/Si multiple quantum wells by transmission electron microscopy methods
Authors
Benedetti A
Cullis AG
+4Â more
Hetherington CJD
Norris DJ
Robbins DJ
Wallis DJ
Publication date
1 April 2003
Publisher
'AIP Publishing'
Abstract
Abstract is not available.
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Last time updated on 30/05/2021