We present an electron interferometer based on near-field diffraction from
two nanostructure gratings. Lau fringes are observed with an imaging detector,
and revivals in the fringe visibility occur as the separation between gratings
is increased from 0 to 3 mm. This verifies that electron beams diffracted by
nanostructures remain coherent after propagating farther than the Talbot length
zT=2d2/λ = 1.2 mm, and hence is a proof of principle for the
function of a Talbot-Lau interferometer for electrons. Distorted fringes due to
a phase object demonstrates an application for this new type of electron
interferometer.Comment: 4 pgs, 6 figure