The need to understand and reject backgrounds in Ge-diode detector
double-beta decay experiments has given rise to the development of pulse shape
analysis in such detectors to discern single-site energy deposits from
multiple-site deposits. Here, we extend this analysis to segmented Ge detectors
to study the effectiveness of combining segmentation with pulse shape analysis
to identify the multiplicity of the energy deposits.Comment: 12 pages, 13 figures, will be submitted to NI