International audienceTo assess the capabilities of the device simulation tool in the field of ElectroStatic Discharges (ESD), two protection structures were studied: a Grounded Gate NMOS transistor (GGNMOS) and a Low Voltage Threshold Silicon Controlled Rectifier (LVTSCR). Both compounds were tested with the Transmission Line Pulse test method and simulated with the software Dessis-ISE. Hence, checking the behaviour of each device in terms of ESD has been possible. (C) 2001 Elsevier Science Ltd. All rights reserved