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Comparative Study of Various Self-Consistent Event Biasing Schemes for Monte Carlo Simulations of Nanoscale MOSFETs
Authors
Shaikh Ahmed
Mihail Nedjalkov
Dragica Vasileska
Publication date
6 March 2013
Publisher
'IntechOpen'
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oai:intechopen.com:43516
Last time updated on 07/05/2020
