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Pattern Recognition based Fault Diagnosis in Industrial Processes: Review and Application
Authors
Eduardo Mendel do Nascimento
Estefhan D. Wandekokem
Flavio M. Varejao
Thomas W. Rauber
Publication date
1 February 2010
Publisher
'IntechOpen'
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oai:intechopen.com:10675
Last time updated on 07/05/2020
