Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration

Authors
Publication date
26 May 2019
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    HAL Descartes

    redirect
    oaioai:HAL:hal-02128847v1
    Last time updated on 23/03/2021