Advances in Aging Compact Model for Hot Carrier Degradation in SiGe HBTs under Dynamic Operating conditions for reliability-aware circuit design

Authors
Publication date
29 September 2019
Publisher
HAL CCSD

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    HAL Descartes

    redirect
    oaioai:HAL:hal-02386290v1
    Last time updated on 23/03/2021