Monitoring a process over time is so important in manufacturing processes to
reduce the wastage of money and time. The purpose of this article is to monitor
profile coefficients instead of a process mean. In this paper, two methods are
proposed for monitoring the intercept and slope of the simple linear profile,
simultaneously. The first one is linear regression, and another one is the
maximum entropy principle. A simulation study is applied to compare the two
methods in terms of the second type of error and average run length. Finally,
two real examples are presented to demonstrate the ability of the proposed
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