Smart projectiles carry various electronic components that can be damaged by severe shock loads. Propagation of shock from the region of initial loading to the locations of critical components can result in their failure. The objective of the research is to mitigate (absorb/reflect/disrupt, etc.) the incident shock loading, including simulating set-back, set-forward and balloting loads on a projectile as it exits the gun muzzle and predicting the structural response of internal electronic components. A detailed finite element analysis of the projectile and internal components is presented. The effect of electronic component mounting location on peak acceleration and RMS acceleration has been studied
