CORE
🇺🇦Â
 make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
X-ray characterization of CMOS imaging detector with high resolution for fluoroscopic imaging application
Authors
Bo Kyung Cha
Cha
+17Â more
Cha
Cha
Chang-Woo Seo
Cho
Cho Rong Kim
Duchang Heo
Farrier
Jong-Boo Kim
Keedong Yang
Min-Seok Shin
Oh-Kyung Kwon
Ryun Kyung Kim
Seongchae Jeon
Shin
Shin
Tae-Bum Lee
Yorkston
Publication date
Publisher
'Elsevier BV'
Doi
Cite
Abstract
Abstract is not available.
Similar works
Full text
Available Versions
Crossref
See this paper in CORE
Go to the repository landing page
Download from data provider
info:doi/10.1016%2Fj.nima.2013...
Last time updated on 05/01/2021