Real‐time in situ micro‐mechanical testing of hard metals using FIB‐SEM

Abstract

The mechanical properties of WC/Co hardmetals were studied using in situ micro-mechanical characterisation techniques. Microscale pillars and cantilever beams were fabricated in different hardmetal microstructures using a focused ion beam microscope (FIB-SEM), to compare the behaviour between different orientation WC single crystals and polycrystalline structures. Micro-specimens in silicon were also tested to analyse the repeatability of the technique. The tests were done using a vacuum-compatible nanoindenter in a scanning electron microscope (SEM), which enabled simultaneous real-time observation of the test and acquisition of the load-displacement data. Please click Additional Files below to see the full abstract

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