Abstract The tip apex dimensions and geometry of the conductive probe remain the major limitation to the resolution of Kelvin probe force microscopy (KPFM). One of the possible strategies to improve the spatial resolution of surface potential images consists in the development of thinner and more durable conductive tips. In an effort to improve the lateral resolution of topography and surface potential maps, we have evaluated high aspect ratio conductive tips created by depositing gold nanoparticles on standard silicon tips. Besides the already known general topographic resolution enhancement offered by these modified tips References [1] L
