Abstract This review discusses static properties of topological defects, such as line defectsdisclinations and dislocations, point defects -hedgehogs (monopoles) and boojums; focal conic domains and tilt grain boundaries in basic types of liquid crystals: uniaxial and biaxial nematics, cholesterics and smectics. We present the most popular experimental techniques to study defects in soft matter, namely, polarizing microscopy and fluorescence confocal polarizing microscopy. The role of bounding surfaces and the so-called surface anchoring that lifts the degeneracy of the order parameter in stability of defects is discussed. Because of the surface anchoring, the equilibridm state of a bounded liquid crystal might contain topological defects. For example, nematic bubbles nucleating during the first-order phase transition from the isotropic melt, might contain point defects (hedgehogs and boojums) and disclination loops when their size is larger than the anchoring extrapolation length defined by the ratio of the Frank elastic constant of the director curvature and the (polar) anchoring coefficient. Depending on the strength of surface anchoring, an edge dislocation might be expelled from the system with ID positional order or be stabilized in the bulk. Furthermore, focal conic domains play the role of "surface anchoring facets" by providing the necessary orientation of the liquid crystal director at the smectic boundary. Introduction Liquid crystals are endowed with continuous symmetries and physical prevalence of correlations of orientation over correlations of position and thus show rich and complex variety of topological defects. Defects in liquid crystals are of various dimensionalities, not only line defects, but also points, walls, and "configurations" (walls, topological solitons). In this review, we consider basic properties (mainly static) of defects in the simplest types of liquid crystals, nematics and smectics, mostly in relationship to the experimental studies and effects that the bounding surfaces have on defects. The experimental techniques of regular polarizing microscopy and more recent fluorescent confoca
