An Efficient Algorithm to Identify Minimal Failure-Causing Schemas from Exhaustive Test Suite

Abstract

Abstract-Combinatorial testing is widely used to detect failures caused by interactions among parameters for its efficiency and effectiveness. Fault localization plays an important role in this testing technique. And minimal failure-causing schema is the root cause of failure. In this paper, an efficient algorithm, which identifies minimal failure-causing schemas from existing failed test cases and passed test cases, is proposed to replace the basic algorithm with worse time performance. Time complexity of basic and improved algorithms is calculated and compared. The result shows that the method that utilizes the differences between failed test cases and passed test cases is better than the method that only uses the sub-schemas of those test cases