IR AND X-RAY PHOTOELECTRON SPECTROSCOPY OF V 2 O 5 , TiO 2 AND V/Ti-OXIDE SOL-GEL DERIVED FILMS INFRARDE^A IN RENTGENSKA FOTOELEKTRONSKA SPEKTROSKOPIJA V 2 O 5 , TiO 2 IN V/Ti-OKSIDNIH SOL-GEL FILMOV
Prejem rokopisa -received: 1998-12-06; sprejem za objavo -accepted for publication: 1998-12-14 V/Ti-oxide films were prepared by dip-coating from sols made by mixing of V-oxoisopropoxide and Ti-propoxide in V:Ti molar ratio in precursors 3:1, 1:1 and 1:3. Amorphous films were obtained after annealing at 300°C (1 h). IR spectroscopic analysis revealed that V=O stretching modes appeared at 1020 cm -1 in the IR spectrum of powder (V:Ti=1:1). However, in the IR spectra of a film with the same molar ratio the bands at 1008 and 914 cm -1 appeared suggesting the presence of V 4+ -O bonds. The new band at 790 cm -1 signalled the V-O-Ti bridging bonds connecting V-O and Ti-O polyhedra. XPS measurements confirmed that initial-state films contained V 5+ , V 4+ and Ti 4+ species, but at the film surface only V 5+ species existed. Sequential depth analysis of films performed with Ar + sputtering showed that the vanadium is reduced to 3+ oxidation state with progressive exposure while titanium is not affected. Key words: electrochromic (EC) devices, oxide films, IR spectroscopy, XPS, oxidation states, sputtering, sol-gel V/Ti-oksidne filme smo pripravili iz koloidnih raztopin V-oksoizopropoksida in Ti-propoksida v 2-propanolu s tehniko potapljanja. Molska razmerja V:Ti v prekurzorjih so zna{ala 3:1, 1:1 in 1:3. Amorfni filmi so nastali po segrevanju na 300°C (1h). V IR spektru pra{kastega vzorca (V:Ti = 1:1) so se valen~na nihanja V=O pojavila pri 1020 cm -1 . V IR spektru filma z istim molskim razmerjem pa se pojavita trakova pri 1008 c
