Photothermal infrared thermography applied to the identification of thin layer thermophysical properties

Abstract

Abstract: The aim of the present work is the thermal non-destructive characterisation of layers at the surface of metals. The sample is sinusoidally heated by means of an argon ion laser and a focal plane array infrared camera (CEDIP IRC 320-4 LW) is used to measure the temperature variations at the surface of the layer. A numerical lock-in procedure allows the detection of very weak temperature variations at the surface of the sample, down to a few mK when working from the acquisition of hundreds of images, yielding amplitude and absolute phase maps for modulation frequencies ranging from 0.1 Hz to 1000 Hz. An inverse procedure uses the Gauss-Newton parameter estimation method, in order to identify the thermal conductivity and the optical absorption coefficient of the layer. Confidence intervals on the parameters can also be estimated by the inverse procedure. More particular attention is devoted to the study of the sensitivity coefficients, as functions of the frequency range and of the radial range along the profiles, in order to optimise the identification procedure

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