The Influence of Strain on the Dielectric Behavior of (Ba, Sr) Til+Q Thin Films Grown by LS-MOCVD on Pt/SiOJSi* m

Authors
Publication date
3 April 2020
Publisher

Abstract

Abstract is not available.

    Similar works

    Full text

    thumbnail-image

    Available Versions

    CiteSeerX

    redirect
    oaioai:CiteSeerX.psu:10.1.1.1046....
    Last time updated on 07/12/2020