Membrane-Based Scanning Force Microscopy

We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.</p

Scanning Force Microscopy of Chromatin

Scanning force microscopy (SFM) is a new method to obtain the topography of surfaces with nanometer-resolution. The ability to image under liquids makes the technique attractive for biological applications, especially for the determination of the ultrastructure of biomolecules under native conditions. One growing field of interest is the investigation of chromatin and chromatin-related structures. Different levels of chromatin condensation were the subject of several previous SFM investigations, from the nucleosomal chain, to the 30-nm fiber, ending with the metaphase chromosome. The SFM yielded new information on such fundamental problems as the core spacing of the nucleosomal chain, the internal structure of the 30-nm fiber and the banding mechanism of metaphase chromosomes. Other investigations dealt with the SFM characterization of polytene chromosomes. This paper reviews the state-of-the-art in SFM chromatin research and discusses future developments in this field

Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions near the surface as and when required. % We performed a series of experiments where we varied the load of the tip, the stiffness of the cantilever and the hardness of the sample surface. % It turned out that only for soft cantilevers could an electrostatic interaction between tip and surface charges be detected, irrespective of the surface properties, i.\,e. basically regardless its hardness. % We explain these results through a model based on the alteration of the tip-sample potential by the additional electric field between charged tip and surface charges

Evaluation of the probing profile of scanning force microscopy tips

It is demonstrated that a high-temperature-treated (305) surface of a SrTiO3 crystal can be used to evaluate the probing profile of AFM tips routinely, to provide a means of selecting perfect tips and to evaluate possible image distortions. This is important in order to recognize typical AFM artifacts which are caused by tips with truncated or twinned peaks which occur rather often in the case of microfabricated AFM needles. By means of selected needles, it is shown that also defective tips can give apparently rather perfect atomic resolution from flat crystal surfaces. Scope and limitations of the resolution of structural defects are discussed as the criterion for real atomic resolution

A scanning force microscopy study on the morphology of elastomer-coagent blends

Atomic force scanning microscopy (AFM) was used to investigate the dispersion of low molecular weight compounds in ethylene-propylene copolymers (EPM). Where other microscopical techniques failed to provide morphological details of this type of blend, as a result of the restricted resolution (light microscopy) or the volatility of the low molecular weight component (SEM), the AFM technique provided surface images, which show inclusions in the matrix of the uncrosslinked polymers