The quality factor in patent systems

In this paper, Bruegel senior Fellow Bruno van Pottelsberghe develops a methodology to compare the quality of examination services in different patent offices. Quality is defined as the extent to which patent offices comply with their patentability conditions in a transparent way. The methodology consists of a two-layer analytical framework encompassing 'legal standards' and their 'operational design', which includes several interdependent components that affect the stringency and transparency of the filtering process.

Considerations on a revision of the quality factor

A modified analytical expression is proposed for the revised quality factor that has been suggested by a liaison group of ICRP and ICRU. With this modification one obtains, for sparsely ionizing radiation, a quality factor which is proportional to the dose average of lineal energy, y. It is shown that the proposed relation between the quality factor and lineal energy can be translated into a largely equivalent dependence on LET. The choice between the reference parameters LET or y is therefore a secondary problem in an impending revision of the quality factor

Quality factor measurements in cavities with mode overlap

A new method of measuring quality factors in cavities is presented. This method is well suited to measure quality factors in undamped cavities as well as in heavily damped cavities, and in addition this method provides a possibility of separating modes and measuring quality factors especially in cases of overlapping modes. Measurements have been carried out on HOM-damped cavities for the DESY/THD linear collider project. Results are presented

Fabrication-tolerant high quality factor photonic crystal microcavities

A two-dimensional photonic crystal microcavity design supporting a wavelength-scale volume resonant mode with a calculated quality factor (Q) insensitive to deviations in the cavity geometry at the level of Q~2x10^4 is presented. The robustness of the cavity design is confirmed by optical fiber-based measurements of passive cavities fabricated in silicon. For microcavities operating in the lambda = 1500 nm wavelength band, quality factors between 1.3-4.0x10^4 are measured for significant variations in cavity geometry and for resonant mode normalized frequencies shifted by as much as 10% of the nominal value.Comment: 3 pages, 3 figure

Controlling the quality factor of a tuning-fork resonance between 9 K and 300 K for scanning-probe microscopy

We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 K to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning probe microscopy.Comment: 5 pages, 6 figure