The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy

Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency near the cantilevers fundamental resonance, where accuracy and sensitivity of force measurement are greatest. Two different methods for reconstructing tip-surface forces from intermodulation spectra are explained. The reconstruction of both conservative and dissipative tip-surface interactions from intermodulation spectra are demonstrated on simulated data.Comment: 25 pages (preprint, double space) 7 figure

Imaging spectroscopy with the atomic force microscope

Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images

Defect-induced perturbations of atomic monolayers on solid surfaces

We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles for several possible geometries. In case of an AFM tip, we also determine the extra force exerted on the tip due to the tip-induced de-homogenization of the monolayer.Comment: 4 pages, 2 figure

Coaxial Atomic Force Microscope Tweezers

We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force vs. applied voltage. We show that the coaxial AFM tweezers (CAT) can perform three dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.Comment: 9 pages, 3 figures, in review at Applied Physics Letter

Spatially resolved manipulation of single electrons in quantum dots using a scanned probe

The scanning metallic tip of a scanning force microscope was coupled capacitively to electrons confined in a lithographically defined gate-tunable quantum dot at a temperature of 300 mK. Single electrons were made to hop on or off the dot by moving the tip or by changing the tip bias voltage owing to the Coulomb-blockade effect. Spatial images of conductance resonances map the interaction potential between the tip and individual electronic quantum dot states. Under certain conditions this interaction is found to contain a tip-voltage induced and a tip-voltage independent contribution.Comment: 4 pages, 4 figure

In Situ Treatment of a Scanning Gate Microscopy Tip

In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and interpretation of the measurements. Contaminations picked up during topography scans may significantly alter this potential. We present an in situ high-field treatment of the tip that improves the tip-induced potential. A quantum dot was used to measure the tip-induced potential.Comment: 3 pages, 1 figure, minor changes to fit published versio

Modeling of micro- and nano-scale domain recording by high-voltage atomic force microscopy in ferroelectrics-semiconductors

The equilibrium sizes of micro- and nano-domains caused by electric field of atomic force microscope tip in ferroelectric semiconductor crystals have been calculated. The domain was considered as a prolate semi-ellipsoid with rather thin domain walls. For the first time we modified the Landauer model allowing for semiconductor properties of the sample and the surface energy of the domain butt. The free carriers inside the crystal lead to the formation of the screening layer around the domain, which partially shields its interior from the depolarization field. We expressed the radius and length of the domain though the crystal material parameters (screening radius, spontaneous polarization value, dielectric permittivity tensor) and atomic force microscope tip characteristics (charge, radius of curvature). The obtained dependence of domain radius via applied voltage is in a good quantitative agreement with the ones of submicron ferroelectric domains recorded by high-voltage atomic force and scanning probe microscopy in LiNbO3 and LiTaO3 crystals.Comment: 21 pages, 5 figure

Low-voltage nanodomain writing in He-implanted lithium niobate crystals

A scanning force microscope tip is used to write ferroelectric domains in He-implanted single-crystal lithium niobate and subsequently probe them by piezoresponse force microscopy. Investigation of cross-sections of the samples showed that the buried implanted layer, $\sim 1$\,\textmu m below the surface, is non-ferroelectric and can thus act as a barrier to domain growth. This barrier enabled stable surface domains of $< 1$\,\textmu m size to be written in 500\,\textmu m-thick crystal substrates with voltage pulses of only 10\,V applied to the tip

Magnetic Response Versus Lift Height of Thin Ferromagnetic Films

The interaction between a magnetic force microscope (MFM) tip and ferromagnetic films of Ni, Co90Fe10 and Py with in-plane magnetization has been investigated. The measured interaction, due to the magnetizing of the films by the MFM tip field, was determined by the phase shift of the cantilever response. The tip-film separation or lift height dependent phase shift was found to be independent of the saturation magnetization of the ferromagnetic film. The result is identical for all three films and micromagnetic simulations give similar results. The reason is at a given tip-sample separation the tip induced magnetization of the film creates a demagnetization field which is equal in magnitude to the tip field at that separation