Electron diffraction of tilted perovskites

Simulations of electron diffraction patterns for each of the known perovskite tilt systems have been performed. The conditions for the appearance of superlattice reflections arising from rotations of the octahedra are modified to take into account the effects of different tilt systems for kinematical diffraction. The use of selected-area electron diffraction as a tool for perovskite structure determination is reviewed and examples are included

Single-Shot Electron Diffraction using a Cold Atom Electron Source

Cold atom electron sources are a promising alternative to traditional photocathode sources for use in ultrafast electron diffraction due to greatly reduced electron temperature at creation, and the potential for a corresponding increase in brightness. Here we demonstrate single-shot, nanosecond electron diffraction from monocrystalline gold using cold electron bunches generated in a cold atom electron source. The diffraction patterns have sufficient signal to allow registration of multiple single-shot images, generating an averaged image with significantly higher signal-to-noise ratio than obtained with unregistered averaging. Reflection high-energy electron diffraction (RHEED) was also demonstrated, showing that cold atom electron sources may be useful in resolving nanosecond dynamics of nanometre scale near-surface structures.Comment: This is an author-created, un-copyedited version of an article published in Journal of Physics B: Atomic, Molecular and Optical Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://dx.doi.org/10.1088/0953-4075/48/21/21400

Many-Beam Solution to the Phase Problem in Crystallography

Solving crystal structures from electron diffraction patterns rather than X-ray diffraction data is hampered by multiple scattering of the fast electrons within even very thin samples and the difficulty of obtaining diffraction data at a resolution high enough for applying direct phasing methods. This letter presents a method by which the effect of multiple scattering is being used for solving the phase problem, allowing the retrieval of electron structure factors from diffraction patterns recorded with varying angle of incidence without any assumption about the scattering potential itself. In particular, the resolution in the diffraction data does not need to be sufficient to resolve atoms, making this method particularly interesting for electron crystallography of 2-dimensional protein crystals and other beam-sensitive complex structures.Comment: 4 pages, 3 figure

Concept of a laser-plasma based electron source for sub-10 fs electron diffraction

We propose a new concept of an electron source for ultrafast electron diffraction with sub-10~fs temporal resolution. Electrons are generated in a laser-plasma accelerator, able to deliver femtosecond electron bunches at 5 MeV energy with kHz repetition rate. The possibility of producing this electron source is demonstrated using Particle-In-Cell simulations. We then use particle tracking simulations to show that this electron beam can be transported and manipulated in a realistic beamline, in order to reach parameters suitable for electron diffraction. The beamline consists of realistic static magnetic optics and introduces no temporal jitter. We demonstrate numerically that electron bunches with 5~fs duration and containing 1.5~fC per bunch can be produced, with a transverse coherence length exceeding 2~nm, as required for electron diffraction

X-Ray sum frequency generation; direct imaging of ultrafast electron dynamics

X-ray diffraction from molecules in the ground state produces an image of their charge density, and time-resolved X-ray diffraction can thus monitor the motion of the nuclei. However, the density change of excited valence electrons upon optical excitation can barely be monitored with regular diffraction techniques due to the overwhelming background contribution of the core electrons. We present a nonlinear X-ray technique made possible by novel free electron laser sources, which provides a spatial electron density image of valence electron excitations. The technique, sum frequency generation carried out with a visible pump and a broadband X-ray diffraction pulse, yields snapshots of the transition charge densities, which represent the electron density variations upon optical excitation. The technique is illustrated by ab initio simulations of transition charge density imaging for the optically induced electronic dynamics in a donor/acceptor substituted stilbene

Exploring transmission Kikuchi diffraction using a Timepix detector

Electron backscatter diffraction (EBSD) is a well-established scanning electron microscope (SEM)-based technique [1]. It allows the non-destructive mapping of the crystal structure, texture, crystal phase and strain with a spatial resolution of tens of nanometers. Conventionally this is performed by placing an electron sensitive screen, typically consisting of a phosphor screen combined with a charge coupled device (CCD) camera, in front of a specimen, usually tilted 70° to the normal of the exciting electron beam. Recently, a number of authors have shown that a significant increase in spatial resolution is achievable when Kikuchi diffraction patterns are acquired in transmission geometry; that is when diffraction patterns are generated by electrons transmitted through an electron-transparent, usually thinned, specimen. The resolution of this technique, called transmission Kikuchi diffraction (TKD), has been demonstrated to be better than 10 nm [2,3]. We have recently demonstrated the advantages of a direct electron detector, Timepix [4,5], for the acquisition of standard EBSD patterns [5]. In this article we will discuss the advantages of Timepix to perform TKD and for acquiring spot diffraction patterns and more generally for acquiring scanning transmission electron microscopy micrographs in the SEM. Particularly relevant for TKD, is its very compact size, which allows much more flexibility in the positioning of the detector in the SEM chamber. We will furthermore show recent results using Timepix as a virtual forward scatter detector, and will illustrate the information derivable on producing images through processing of data acquired from different areas of the detector. We will show results from samples ranging from gold nanoparticles to nitride semiconductor nanorods

Annealing-induced reduction in nanoscale heterogeneity of thermally evaporated amorphous As2S3 films

The morphology and structural order of thermally deposited and annealed amorphous As2S3 films have been investigated using high resolution transmission electron microscopy. It was found that both the as-deposited and annealed films contained sparsely distributed nanocrystallites of the orpiment As2S3 crystalline phase. However, from selected area electron diffraction both films appeared amorphous. Fluctuation electron microscopy revealed that the as-deposited film contained greater nanoscale inhomogeneity. Low temperature annealing reduced the nanoscale inhomogeneity and resulted in a more homogeneous and energetically favorable network. The reduction in nanoscale inhomogeneity upon low temperature annealing was accompanied by the appearance of a first sharp diffraction peak in the diffraction pattern. This first-sharp diffraction peak has been attributed to chemical ordering of interstitial voids. Our measurements suggest that this chemical short-range ordering is associated with the dissolution of the energetically unfavorable larger correlated structures that contribute to the inhomogeneity of the as-deposited film