Automated software-based in-field self-test program synthesis

This paper presents a methodology to automate functional Software-Based Self-Test program development. We rely on the previously published research on modeling processors using subclass of acyclic directed graphs called High-Level Decision Diagrams (HLDD). The HLDD model of the processor gets generated from its Instruction Set Architecture. The HLDD model is then used together with beforehand prepared assembly program templates in the generation of the complete self-test program. The research presented in this paper includes examples of test generation for the 32-bit SPARCv8 microprocessor Leon 3. The experimental results demonstrate that automatically generated SBST program obtains comparable to the state-of the art fault coverage data

In-system programming of non-volatile memories on microprocessor-centric boards

With the continuous growth of capacity of non-volatile memories (NVM) in-system programming (ISP) has become the most time-consuming step in post-assembly phase of board manufacturing. This paper presents a method to assess ISP solutions for on-chip and on-board NVMs. The major contribution of the approach is the formal basis for evaluation of the state-of-the-art ISP solutions. The proposed comparison pin-points the time losses, that can be eliminated by the use of multiple page buffers. The technique has proven to achieve exceptionally short programming time, which is close to the operational speed limit of modern NVMs. The method is based on the ubiquitous JTAG access bus which makes it applicable for the most board manufacturing strategies despite a slow nature of JTAG bus

On In-System Programming of Non-volatile Memories

With the continuous growth of capacity of non-volatile memories (NVM) in-system programming (ISP) has become the most time-consuming step in post-assembly phase of board manufacturing. This paper presents a method to assess ISP solutions for on-chip and on-board NVMs. The major contribution of the approach is the formal basis for comparison of state-of-the-art ISP solutions. The effective comparison pin-points the time losses, that can be eliminated by the use of multiple page buffers. The technique has proven to achieve exceptionally short programming time, which is close to the operational speed limit of modern NVMs. The method is based on the ubiquitous JTAG access bus which makes it applicable for the most board manufacturing strategies despite a slow nature of JTAG bus

Session S3H BIST Analyzer: a Training Platform for SoC Testing

other Pseudo-Random Pattern Generators (PRPG) have become one of the central elements used in testing and self testing of contemporary complex electronic systems like processors, controllers, and high-performance integrated circuits. The current paper describes a training and research tool for learning basic and advanced issues related to PRPG-based test pattern generation. Unlike other similar systems, this tool facilitates study of various test optimization problems, allows fault coverage analysis for different circuits and with different LFSR parameters. The main didactic aim of the tool is presenting complicated concepts in a comprehensive graphical and analytical way. The multi-platform JAVA runtime environment allows for easy access and usage of the tool both in a classroom and at home. The BIST Analyzer represents an integrated simulation, training, and research environment that supports both analytic and synthetic way of learning. Due to the above mentioned facts the tool provides a unique training platform to use in courses on electronic testing and design for testability. The BIST Analyzer has got a positive feedback from students of Darmstadt TU (Germany) and Tallinn TU (Estonia). Index Terms – Courses on electronic testing and design, Training and research tool, Web-based training, Java platform