Modern aspects of clinico-pathological characteristics and treatment of malignant colonic obstruction

The colorectal cancer is diagnosedatits complicated stage in 40 to 60%, including 35% with symtptoms of colonic obstruction. The postoperative mortality remains high, as well ast helethality. Our aim is to study the up-to-date aspects in the clinicopathological characteristics and treatment of malignant colonic obstruction (colon ileus cancer). From 1009 patients operated for24 years (1982-2005) with colorectal cancer with median age 67 years 378 patients (37.4%) were over 70years. The most important aim is too vercome the obstruction and restore the intestinal passage and if possible performare section of the tumor. The surgical tactics in case of malignat obstruction of the right colon is well described in the literature, but the question of tactics in case of left colon remains-single or double-tage operation. Other methods have also been discussed, suchascecostomy, NdYAG laser vaporization of the obstructing tumor. The stenting is related with significant advantages and is used for palliative procedures or as a bridge to surgery.Scripta Scientifica Medica 2011;43(2):63-7

Thermal effects in Ni/Au and Mo/Au gate metallization AlGaN/GaN HEMT's reliability

AlGaN/GaN high electron mobility transistors (HEMT) are key devices for the next generation of high-power, high-frequency and high-temperature electronics applications. Although significant progress has been recently achieved [1], stability and reliability are still some of the main issues under investigation, particularly at high temperatures [2-3]. Taking into account that the gate contact metallization is one of the weakest points in AlGaN/GaN HEMTs, the reliability of Ni, Mo, Pt and refractory metal gates is crucial [4-6]. This work has been focused on the thermal stress and reliability assessment of AlGaN/GaN HEMTs. After an unbiased storage at 350 o C for 2000 hours, devices with Ni/Au gates exhibited detrimental IDS-VDS degradation in pulsed mode. In contrast, devices with Mo/Au gates showed no degradation after similar storage conditions. Further capacitance-voltage characterization as a function of temperature and frequency revealed two distinct trap-related effects in both kinds of devices. At low frequency (< 1MHz), increased capacitance near the threshold voltage was present at high temperatures and more pronounced for the Ni/Au gate HEMT and as the frequency is lower. Such an anomalous “bump” has been previously related to H-related surface polar charges [7]. This anomalous behavior in the C-V characteristics was also observed in Mo/Au gate HEMTs after 1000 h at a calculated channel temperatures of around from 250 o C (T2) up to 320 ºC (T4), under a DC bias (VDS= 25 V, IDS= 420 mA/mm) (DC-life test). The devices showed a higher “bump” as the channel temperature is higher (Fig. 1). At 1 MHz, the higher C-V curve slope of the Ni/Au gated HEMTs indicated higher trap density than Mo/Au metallization (Fig. 2). These results highlight that temperature is an acceleration factor in the device degradation, in good agreement with [3]. Interface state density analysis is being performed in order to estimate the trap density and activation energy

Structural and morphological studies on wet-etched InAlGaN barrier HEMT structures

The quaternary nitride-based high electron mobility transistor (HEMT) has been recently a focus of interest because of the possibility to grow lattice-matched barrier to GaN and tune the barrier bandgap at the same time

High Temperature Pulsed and DC Performance of AlInN/GaN HEMTs

The AlGaN/GaN high-electron mobility transistors (HEMTs) have been considered as promising candidates for the next generation of high temperature, high frequency, high-power devices. The potential of GaN-based HEMTs may be improved using an AlInN barrier because of its better lattice match to GaN, resulting in higher sheet carrier densities without piezoelectric polarization [1]. This work has been focused on the study of AlInN HEMTs pulse and DC mode characterization at high temperature

Tunable Thermal Energy Transport across Diamond Membranes and Diamond-Si Interfaces by Nanoscale Graphoepitaxy

The development of electronic devices, especially those that involve heterogeneous integration of materials, has led to increased challenges in addressing their thermal operational-temperature demands. The heat flow in these systems is significantly influenced or even dominated by thermal boundary resistance at interface between dissimilar materials. However, controlling and tuning heat transport across an interface and in the adjacent materials has so far drawn limited attention. In this work, we grow chemical-vapor-deposited (CVD) diamond on silicon substrates by graphoepitaxy and experimentally demonstrate tunable thermal transport across diamond membranes and diamond-silicon interfaces. We observed the highest diamond-silicon thermal boundary conductance (TBC) measured to date and increased diamond thermal conductivity due to strong grain texturing in the diamond near the interface. Additionally, non-equilibrium molecular-dynamics (NEMD) simulations and a Landauer approach are used to understand the diamond-silicon TBC. These findings pave the way for tuning or increasing thermal conductance in heterogeneously integrated electronics that involve polycrystalline materials and will impact applications including electronics thermal management and diamond growth

Thermal management of GaN HEMT devices using serpentine minichannel heat sinks

An experimental and numerical investigation of water-cooled serpentine rectangular minichannel heat sinks (MCHS) has been performed to assess their suitability for the thermal management of gallium nitride (GaN) high-electron-mobility transistors (HEMTs) devices. A Finite Element-based conjugate heat transfer model is developed, validated experimentally and used to determine the optimal minichannel width and number of minichannels for a case with a uniform heat flux of 100 W/cm². The optimisation process uses a 30 point Optimal Latin Hypercubes Design of Experiments, generated from a permutation genetic algorithm, and accurate metamodels built using a Moving Least Square approach. A Pareto front is then constructed to enable the compromises available between designs with a low pressure drop and those with low thermal resistance to be explored and an appropriate minichannel width and number of minichannels to be chosen. These parameters are then used within conjugate heat transfer models of a serpentine MCHS with silicon, silicon carbide, diamond and graphene heat spreaders placed above a GaN HEMT heating source of area 4.8 × 0.8 mm², generating 1823 W/cm². A nanocrystalline diamond (NCD) layer with thickness of 2 µm is mounted on the top surface of the GaN HEMT to function as a heat spreader to mitigate the hot spots. The effect of volumetric flow rate and heat spreader thickness on the chip temperature has been investigated numerically and each of these has been shown to be influential. For example, at a volumetric flow rate of 0.10 l/min, the maximum chip temperature can be reduced from 124.7 °C to 96.7 °C by employing a 25 µm thick graphene heat spreader attached to the serpentine MCHS together with a NCD layer compared with a serpentine MCHS without these heat spreaders