10 research outputs found
The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure
In this paper, the solution of the problem of identification of thermal
properties of investigated multi-layer structure is presented. In order of
that, artificial neural network was used to find the set of thermal properties
for which the complex contrast characteric derived fits the best to the one
evaluated basing upon experimenatal data.Comment: Submitted on behalf of TIMA Editions
(http://irevues.inist.fr/tima-editions
The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure
This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence