10 research outputs found

    The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

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    In this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.Comment: Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions

    The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

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    This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence

    Quality investigation of joint of bipolar transistor chip and lead frame by thermal wave method

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    Advances in islet encapsulation technologies

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