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4 research outputs found

Reliability assessment of discrete-trap memories for NOR applications

Author: A.L. Lacaita
A.S. Spinelli
C. Monzio Cornpagnoni
D. lelmini
R. Sotgiu
Publication venue: Institute of Electrical and Electronics Engineers (IEEE)
Publication date
Field of study

In-memory computing with ferroelectrics

Author: D lelmini
K Ni
P Yao
PM Sheridan
S Yu
TN Theis
V Garcia
Z Wang
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

Photo-regulated conductivity of polycaprolactone honeycomb-patterned porous films containing azobenzene-functionalized reduced graphene oxide

Author: B. R. Goldsmith
B. Y. Choi
C. Bora
C. Dri
C. S. Smithson
D. Djurado
D. Lelmini
D. Oner
E. Bekyarova
G. L. Chen
G. Widawski
H. S. Lim
H. Yabu
I. Meric
J. K. Kim
J. Liang
J. M. Mativetsky
J. Y. Park
K. S. Novoselov
L. Chang
L. H. Liu
M. H. Li
O. Tsutsumi
P. X. Thinh
R. Chandra
R. S. Stoll
S. Drewniak
S. L. Lim
S. Tarkuc
S. W. Basuki
S. Wang
S. Yamamoto
S. Yang
T. Nishikawa
T. Ubukata
U. Male
U. Male
V. Ferri
X. Q. Zhang
X. Zhang
X. Zhang
Y. Feng
Y. L. Wu
Y. Y. Feng
Y. Y. Liang
Y. Zheng
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

Resistive random access memory and its applications in storage and nonvolatile logic

Author: Adam G C
Asamitsu A
Beck A
Belmonte A
Bousoulas P
Bousoulas P
Burr G W
Chang K C
Chen C Y
Chen H
Chen P Y
Chen Y C
Deng Y X
Dongbin Zhu
Gao B
Gao B
Gao B
Gokmen T
Gopalakrishnan K
Goux L
Hsieh M C
Hsu C W
Huang P
Huang P
Huang Y
Jo S H
Jo S H
Kang J F
Kim S
Kim W G
Koo Y
Koo Y
Lee H Y
Lee W
Lelmini D
Li H
Li H
Li H T
Li H T
Li Z W
Lifeng Liu
Lim S
Linn E
Liu L F
Liu L F
Liu L F
Luo Q
Luo Q
Luo Q
Ni L
Ota K
Palma G
Piccolboni G
Prakash A
Salvo B D
Son J Y
Sun B
Sun H T
Tsuruoka T
Watanabe Y
Wensheng Shen
Wong H S P
Xing Zhang
Xu X
Yi Li
Yu S M
Yu S M
Zhang F F
Zhang H W
Zheng Zhou
Publication venue: 'IOP Publishing'
Publication date
Field of study

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