The Hunting of the Bump: On Maximizing Statistical Discrepancy

Anomaly detection has important applications in biosurveilance and environmental monitoring. When comparing measured data to data drawn from a baseline distribution, merely, finding clusters in the measured data may not actually represent true anomalies. These clusters may likely be the clusters of the baseline distribution. Hence, a discrepancy function is often used to examine how different measured data is to baseline data within a region. An anomalous region is thus defined to be one with high discrepancy. In this paper, we present algorithms for maximizing statistical discrepancy functions over the space of axis-parallel rectangles. We give provable approximation guarantees, both additive and relative, and our methods apply to any convex discrepancy function. Our algorithms work by connecting statistical discrepancy to combinatorial discrepancy; roughly speaking, we show that in order to maximize a convex discrepancy function over a class of shapes, one needs only maximize a linear discrepancy function over the same set of shapes. We derive general discrepancy functions for data generated from a one- parameter exponential family. This generalizes the widely-used Kulldorff scan statistic for data from a Poisson distribution. We present an algorithm running in $O(\smash[tb]{\frac{1}{\epsilon} n^2 \log^2 n})$ that computes the maximum discrepancy rectangle to within additive error $\epsilon$, for the Kulldorff scan statistic. Similar results hold for relative error and for discrepancy functions for data coming from Gaussian, Bernoulli, and gamma distributions. Prior to our work, the best known algorithms were exact and ran in time $\smash[t]{O(n^4)}$.Comment: 11 pages. A short version of this paper will appear in SODA06. This full version contains an additional short appendi

GRA Coupled with Fuzzy Linguistic Reasoning for Quality Productivity Improvement in Electrical Discharge Machining (EDM)

In the present work, the use of the grey relational analysis and fuzzy logic combined with Taguchi method has been proposed for optimizing Electrical Discharge Machining (EDM) process with multiple responses involved. The study aims at simultaneous optimization of quality and productivity. Quality and productivity are correlated inversely. If product quality is intended to be increased then extent of productivity is to be compromised and vice versa. Therefore, a compatible balance is necessary between productivity and product quality. The study addresses a case study related to EDM in which material removal rate (MRR) and surface roughness (Ra value) of the machined work surface have been optimized