A Chip Device For On-line Assessment In Nano-scale Surface Manufacture

This project aims to create a novel system based on interferometry and wavelength spatial scanning techniques using breakthrough micro-/nanotechnology and optical methodologies. The system will be used for online nano-scale surface measurement, which represents an important step change in the fields of surface metrology

China: Case study on Human Development Progress towards the Millennium Developmental Goals at the Sub-National Level

human development, millennium development goals, mdgs