Direct Observation of Sub-Poissonian Temporal Statistics in a Continuous Free Electron Beam with Sub-picosecond Resolution

We present a novel method to measure the arrival time statistics of continuous electron beams with sub-ps resolution, based on the combination of an RF deflection cavity and fast single electron imaging. We observe Poissonian statistics within time bins from 100~ns to 2~ns and increasingly pronounced sub-Poissonian statistics as the time bin decreases from 2~ps to 340~fs. This 2D streak-camera in principle enables femtosecond-level arrival time measurements, paving the way to observing Pauli blocking effects in electron beams and thus serving as an essential diagnostic tool towards degenerate electron beam sources for free electron quantum optics