Termination of Single Crystal Bi2Se3 Surfaces Prepared by Various Methods

Bismuth Selenide (Bi2Se3) is a topological insulator with a two-dimensional layered structure that enables clean and well-ordered surfaces to be prepared by cleaving. Although some studies have demonstrated that the cleaved surface is terminated with Se, as expected from the bulk crystal structure, other reports have indicated either a Bi- or mixed-termination. Low energy ion scattering (LEIS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) are used here to compare surfaces prepared by ex situ cleaving, in situ cleaving, and ion bombardment and annealing (IBA) in ultra-high vacuum (UHV). Surfaces prepared by in situ cleaving and IBA are well ordered and Se-terminated. Ex situ cleaved samples could be either Se-terminated or Bi-rich, are less well ordered and have adsorbed contaminants. This suggests that a chemical reaction involving atmospheric contaminants, which may preferentially adsorb at surface defects, could contribute to the non-reproducibility of the termination.Comment: 31 pages, 10 figures, 1 tabl

Surface Structure of In Situ Cleaved Single Crystal Bi2Se3 Measured by Low Energy Ion Scattering

Bismuth Selenide is a two-dimensional topological insulator material composed of stacked quintuple layers (QL). The layers are held together by a weak van der Waals force that enables surface preparation by cleaving. Low energy ion scattering experiments (LEIS) show that Bi2Se3 cleaved under ultra-high vacuum (UHV) has a Se-terminated structure that is consistent with cleaving between QLs. Comparison of experimental data to molecular dynamics simulations confirms the Se-termination and provides an estimate of the surface relaxation.Comment: 23 pages, 6 figures, 1 tabl

Double Alternating Minimization (DAM) for Phase Retrieval in the Presence of Poisson Noise and Pixelation

Optical detectors, such as photodiodes and CMOS cameras, can only read intensity information, and thus phase information of wavefronts is lost. Phase retrieval algorithms are used to estimate the lost phase and reconstruct an accurate effective pupil function, where the squared modulus of its Fourier transform is detected by a camera. However, current algorithms such as the Gerchberg-Saxton algorithm and Fienup-style algorithm do not consider the detector sampling rate and shot noise introduced by photon detection. If the sampling rate is low, we must interpolate the detected image in order to accurately reconstruct its pupil function. Here, we develop an appropriate estimation method for interpolating the detected image by using penalized I-divergence and then use the interpolated image for phase retrieval. In our simulation, after 300 iterations of our DAM algorithm, the phase-retrieved pupil function has a root-mean-squared error of about 43±3% less than Fienup-style algorithm with nearest neighbor interpolation when one hundred million photons are collected