Direct measurement of attachment of 220Rn progeny on aerosols by atomic force microscopy

Atomic force microscopy (AFM) is becoming a powerful tool for the study of nuclear tracks in materials such as CR-39. Coupled with its capability of observing near nm aerosol particles, we have utilized the AFM to observe the radon progeny-loaded aerosol particles deposited on surfaces of CR-39 and to observe the corresponding etch pits produced by the α-particles emitted from the radon progenies. A special platform was built so that after the aerosol particles on the CR-39 have been scanned and recorded, the CR-39 can be etched and then scanned for the etch pits at the same location. Both 222Rn and 220Rn progenies were used in the study. The progenies were generated by the appropriate radon sources and mixed with aerosol particles generated by aerosol generators. The aerosol size distributions were analyzed by a scanning mobility particle sizer. Some of the limitations and difficulties of the technique will be described. The results enable us to examine the attachment process including multiple attachments of radon progenies on aerosols. © 2003 Elsevier Science B.V. All rights reserved.link_to_subscribed_fulltex