Damage production in silicon irradiated with 112 MeV Ar ions

Silicon samples were irradiated below 50 K with 112 MeV Ar ions. Defect Silicon samples were irradiated below 50 K with 112 MeV Ar ions. Defec

Experimental studies of single-event effects induced by heavy ions

This paper presents the results of ground-based heavy ion test of This paper presents the results of ground-based heavy ion test o