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2 research outputs found
Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy
Author
A Malachias
A Rastelli
+42Â more
A Rastelli
A Rosenauer
BJ Spencer
C Teichert
D Briggs
D Schikora
G Biasiol
G Masini
G Medeiros-Ribeiro
G Medeiros-Ribeiro
I Daruka
J Stangl
J Stangl
J Tersoff
JW Christian
K Nakajima
L Pavesi
M Valvo
MA Migliorato
MYA Valakh
MYA Valakh
Mykhailo Ya Valakh
NN Ledentsov
OG Schmidt
OP Pchelyakov
P Liu
PB Joyce
PB Joyce
Peter M. Lytvyn
R Hanson
R Magalhaes-Paniago
S Cosentino
S Fafard
S Leite Marina
Semyon S. Ponomaryov
TI Kamins
Volodymyr O. Yukhymchuk
XZ Liao
Y Tu
Z Yuan
ZF Krasil’nik
ZF Krasil’nik
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
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Crossref
Scanning Probe Microscopy in Practical Diagnostic: 3D Topography Imaging and Nanometrology
Author
ABH Tay
B Cappella
+56Â more
CC Williams
CG Morgan
CY Jin
D Keller
D Tranchida
DN Lobanov
FM Ross
G Apostolopoulos
G Binnig
G Binnig
G Binnig
GE Cirlin
H Jacobs
H-J Butt
HC Liu
J Castle
JS Villarrubia
L Zhang
LS Dongmo
M Hanke
M Itoh
M Schmidbauer
MY Valakh
N Bonnet
O Gröning
OS Lytvyn
P Markiewicz
P Wolf De
PM Lytvyn
PM Lytvyn
PM Lytvyn
R Young
RD Young
S Belaidi
S Fafard
S Maimon
SK Mehta
T Ogura
T Sugaya
T Sugaya
U HĂĽbner
U Rabe
VA Shchukin
VA Shchukin
VV Strelchuk
XD Wang
Y Martin
Y Martin
YE Geguzin
Z Minhua
Z Ye
ZF Krasil’nik
ZF Krasil’nik
ZM Wang
ZM Wang
ZM Wang
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
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