7 research outputs found
X-ray diffraction scattering and determination of the structural parameters of a film with a variable strain gradient
Full text linkEffect of the number of pairs of the layers on the quality of the superlattices of the In x Ga1 − x As/GaAs/.../GaAs(001) type grown by molecular beam epitaxy under computer control
Full text linkApplication of a pseudomorphous layer on a vicinal substrate as a test sample for high-resolution X-ray diffractometry
Full text linkDefects of the structure of semiconductor superlattices grown on the basis of II–VI alloys
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