CCl4-doped semi-insulating InP as a buffer layer in GaInAs/InP high electron mobility transistors

The application of CCl4-doped semi-insulating InP as a buffer layer in a pseudomorphic Ga0.2In0.8P/Ga0.47In0.53As/InP high electron mobility transistor (HEMT) grown by metalorganic chemical vapor deposition is reported. This Al-free InP-base HEMT with a gate length of 1.3 μm has extrinsic transconductances of 420 and 610 mS/mm at 300 and 77 K, respectively. A cutoff frequency of 15 GHz and a maximum oscillation frequency of 40 GHz are obtained. The results demonstrate the CCl4-doped semi-insulating InP is a promising buffer layer for InP-based HEMT. © 1996 American Institute of Physics.published_or_final_versio

Integration of GaInP/GaAs heterojunction bipolar transistors and high electron mobility transistors

Integration of carbon-doped GaInP/GaAs heterojunction bipolar transistors (HBT's) and high electron mobility transistors (HEMT's) is demonstrated by growing an HBT on the top of a HEMT. A current gain of 60. a cutoff frequency of 59 GHz and a maximum oscillation frequency of 68 GHz were obtained for a 5 × 15 μm 2 self-aligned HBT. The HEMT with a gate length of 1.5 μm has a transconductance of 210 mS/mm, a cutoff frequency of 9 GHz and a maximum oscillation frequency of 22 GHz. It is shown that the GaInP/GaAs HBT on the HEMT is the simple Bi-FET tecnology suitable for microwave and mixed single applications.published_or_final_versio

Novel InGaP/GaAsSb/GaAs DHBTs

A study of the InGaP/GaAsSb/GaAs double heterojunction bipolar transistor (DHBT) is presented. Novel device structure is designed. A fully strained pseudomorphic GaAsSb with 8.0% Sb composition is used as the base layer, while an InGaP layer as the emitter which both eliminates the misfit dislocations and increases the valence band discontinuity at the InGaP/GaAsSb interface. A current gain of 22.6 has been obtained from the InGaP/GaAsSb/GaAs DHBT. Typical turn-on voltage of the device is 0.973 V which is 0.116V lower than that of traditional InGaP/GaAs HBT. Moreover, the current transport mechanism of the InGaP/GaAsSb/GaAs DHBTs is investigated. These results show that GaAsSb is a promising base material for reducing the turn-on voltage of GaAs HBTs.published_or_final_versio

Fabrication and characteristics of a GaInP/GaAs heterojunction bipolar transistor using a selective buried sub-collector

A C-doped GaInP/GaAs heterojunction bipolar transistor (HBT) with a selective buried sub-collector has been fabricated by two growth steps. The active HBT region was made on the selective buried sub-collector layer with minimum overlap of the extrinsic base and the sub-collector region resulting in substantial reduction of the base-collector capacitance. The experiment shows that the base-collector capacitance is reduced to about half of that of a conventional HBT while the base resistance remains unchanged resulting in a 40-50% increase in the maximum oscillation frequency. Both DC and RF characteristics are investigated and compared with a conventional HBT. A current gain of 40 cutoff frequency of 50 GHz and maximum oscillation frequency of 140 GHz were obtained for the GaInP/GaAs HBT. It is demonstrated that the selective buried sub-collector provides an effective means for enhancing RF performance of an HBT. © 1997 IEEE.published_or_final_versio

High efficiency, low offset voltage InGaP/GaAs power heterostructure-emitter bipolar transistors with advanced thermal management

High efficiency, low offset voltage InGaP/GaAs power heterostructure-emitter bipolar transistors (HEBTs) have been demonstrated. The large signal performance of the HEBTs is characterized. Output power of 0.25 W with power added efficiency (PAE) of 63.5% at 1.9 GHz has been achieved from a 26-finger HEBT with total emitter area of 873.6 μm2. Output power of 1.0 W with PAE of 63% has been obtained from the composition of four above-mentioned power cells at the optimum conditions of impedance matching. The thermal performance of HEBT is presented and the results show better thermal management than conventional HBT. The experimental results demonstrate good power performance and capability of HEBTs.published_or_final_versio

Thermal stability of current gain in InGaP/GaAsSb/GaAs double-heterojunction bipolar transistors

The thermal stability of current gain in InGaP/GaAsSb/GaAs double-heterojunction bipolar transistors (DHBTs) is investigated. The experimental results show that the current gain in the InGaP/GaAsSb/GaAs DHBTs is nearly independent of the substrate temperature at collector current densities > 10 A/cm2, indicating that the InGaP/GaAsSb/GaAs DHBTs have excellent thermal stability. This finding suggests that the InGaP/GaAsSb/GaAs DHBTs have larger emitter-base junction valence-band discontinuity than traditional GaAs-based HBTs. © 2004 American Institute of Physics.published_or_final_versio

Current transport mechanism in InGaP/GaAsSb/GaAs double-heterojunction bipolar transistors

We have developed InGaP/GaAsSb/GaAs double-heterojunction bipolar transistors (DHBTs) with low turn-on voltage and high current gain by using a narrow energy bandgap GaAsSb layer as the base and an InGaP layer as the emitter. The current transport mechanism is examined by measuring both of the terminal currents in forward and reverse mode. The results show that the dominant current transport mechanism in the InGaP/GaAsSb/GaAs DHBTs is the transport of carriers across the base layer. This finding suggests that the bandgap offset produced by incorporating Sb composition into GaAs mainly appears on the valence band and the conduction-band offset in InGaP/GaAsSb heterojunction is very small. © 2004 American Institute of Physics.published_or_final_versio

A class of non-zero-sum stochastic differential investment and reinsurance games

In this article, we provide a systematic study on the non-zero-sum stochastic differential investment and reinsurance game between two insurance companies. Each insurance company’s surplus process consists of a proportional reinsurance protection and an investment in risky and risk-free assets. Each insurance company is assumed to maximize his utility of the difference between his terminal surplus and that of his competitor. The surplus process of each insurance company is modeled by a mixed regime-switching Cramer–Lundberg diffusion approximation process, i.e. the coefficients of the diffusion risk processes are modulated by a continuous-time Markov chain and an independent market-index process. Correlation between the two surplus processes, independent of the risky asset process, is allowed. Despite the complex structure, we manage to solve the resulting non-zero sum game problem by applying the dynamic programming principle. The Nash equilibrium, the optimal reinsurance/investment, and the resulting value processes of the insurance companies are obtained in closed forms, together with sound economic interpretations, for the case of an exponential utility function.postprin

Energy loss of monoenergetic positrons passing through a thin carbon foil

In this paper, the measurements of energy loss and energy loss straggling for 1-10 keV monoenergetic positrons passing through thin carbon foils of different thicknesses ranging from 1.0 to 5.0 μg/cm 2 are presented. The stopping power dE/dx and positron transmission coefficient as a function of incident positron energy and foil thickness have also been investigated. Particularly, the experimental results obtained are compared with those from Monte Carlo simulation and theory with a view to providing a way to determine the actual thickness of a carbon foil. The ratio of the energy straggling to the foil thickness seems to have a linear relation with the beam energy. © 2011 Elsevier B.V. All rights reserved.postprin

Low turn-on voltage InGaP/GaAsSb/GaAs double HBTs grown by MOCVD

A novel InGaP/GaAs0.92Sb0.08/GaAs double heterojunction bipolar transistor (DHBT) with low turn-on voltage has been fabricated. The turn-on voltage of the DHBT is typically 150 mV lower than that of the conventional InGaP/GaAs HBT, indicating that GaAsSb is a suitable base material for reducing the turn-on voltage of GaAs HBTs. A current gain of 50 has been obtained for the InGaP/GaAs0.92Sb0.08/GaAs DHBT. The results show that InGaP/GaAsSb/GaAs DHBTs have a great potential for reducing operating voltage and power dissipation.published_or_final_versio