21,514 research outputs found
DJpsiFDC: an event generator for the process at LHC
DJpsiFDC is an event generator package for the process .
It generates events for primary leading-order processes. The package
could generate a LHE document and this document could easily be embedded into
detector simulation software frameworks. The package is produced in Fortran
codes.Comment: 10 pages, 3 figure
Exploring Bosonic Mediator of Interaction at BESIII
We present a comprehensive investigation on the possibility of the search for
new force mediator boson in collision and decay at the
BESIII experiment. The typical interactions of boson coupling to leptons
and quarks are explored. The production and decay properties of this
particle, the product/decay chains and
, and exclusion limits on the reduced
coupling strength parameters as functions of boson mass are presented. With
the data set of tens of fb or , we find that the
exclusion limits on the coupling strength parameters fall in the range of
, depending on assuming the decay width 10
eV100 eV reasonably, for various hypotheses in the literature.
According to our estimation, the search for new force mediator boson in
both collision and decay are accessible in nowadays BESIII
experiment.Comment: To appear in EPJC; 26 pages, 13 figures; Fig.s (5, 6, 9, 11, 12, 13)
are reploted and their discussion are updated; three paragraphs, two
equations and 1 table are added; two errors are correcte
Determination of Density of Trap States at Y\u3csub\u3e2\u3c/sub\u3eO\u3csub\u3e3\u3c/sub\u3e-Stabilized ZrO\u3csub\u3e2\u3c/sub\u3e/Si Interface of Yba\u3csub\u3e2\u3c/sub\u3eCu\u3csub\u3e3\u3c/sub\u3eO\u3csub\u3e7-Ī“\u3c/sub\u3e/Y\u3csub\u3e2\u3c/sub\u3eO\u3csub\u3e3\u3c/sub\u3e-Stabilized ZrO\u3csub\u3e2\u3c/sub\u3e/Si Capacitors
Yba2Cu3O7-Ī“/yttriaāstabilized zirconia (YSZ)/silicon superconductorāinsulatorāsemiconductor capacitors are characterized with currentāvoltage and capacitanceāvoltage (CāV) measurements at different temperatures between 223 and 80 K. As a result of āāfreezingāā of mobile ions in YSZ, effects of trapped charge at the YSZ/Si interface dominate the device electrical properties at superconducting temperatures. Density of interface states and its temperature dependence are determined using a modified high frequency CāV method, in which the temperature dependences of band gap, Fermi level, and active dopant and intrinsic carrier concentrations are considered. At superconducting temperatures, e.g., 80 K, the interface state density within the band gap is reduced to lower than 1Ć1011 cmā2āeV at midgap. The low interface state density at the YSZ/Si interface is important for acceptable performance and reliability devices made up of such capacitors
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