Computational search for ultrasmall and fast skyrmions in the Inverse Heusler family

Skyrmions are magnetic excitations that are potentially ultrasmall and topologically protected, making them interesting for high-density all-electronic ultrafast storage applications. While recent experiments have confirmed the existence of various types of skyrmions, their typical sizes are much larger than traditional domain walls, except at very low temperature. In this work, we explore the optimal material parameters for hosting ultra-small, fast, and room temperature stable skyrmions. As concrete examples, we explore potential candidates from the inverse Heusler family. Using first-principles calculations of structural and magnetic properties, we identify several promising ferrimagnetic inverse Heusler half-metal/near half-metals and analyze their phase space for size and metastability.Comment: 7 pages, 3 figures, 1 tabl

Reduced sensitivity to process, voltage and temperature variations in activated perpendicular magnetic tunnel junctions based stochastic devices

True random number generators (TRNGs) are fundamental building blocks for many applications, such as cryptography, Monte Carlo simulations, neuromorphic computing, and probabilistic computing. While perpendicular magnetic tunnel junctions (pMTJs) based on low-barrier magnets (LBMs) are natural sources of TRNGs, they tend to suffer from device-to-device variability, low speed, and temperature sensitivity. Instead, medium-barrier magnets (MBMs) operated with nanosecond pulses - denoted, stochastic magnetic actuated random transducer (SMART) devices - are potentially superior candidates for such applications. We present a systematic analysis of spin-torque-driven switching of MBM-based pMTJs (Eb ~ 20 - 40 kBT) as a function of pulse duration (1 ps to 1 ms), by numerically solving their macrospin dynamics using a 1-D Fokker-Planck equation. We investigate the impact of voltage, temperature, and process variations (MTJ dimensions and material parameters) on the switching probability of the device. Our findings indicate SMART devices activated by short-duration pulses (< 1 ns) are much less sensitive to process-voltage-temperature (PVT) variations while consuming lower energy (~ fJ) than the same devices operated with longer pulses. Our results show a path toward building fast, energy-efficient, and robust TRNG hardware units for solving optimization problems.Comment: 7 pages, 5 figure