Adder Based Residue to Binary Number Converters for (2n - 1; 2n; 2n + 1)

Copyright © 2002 IEEEBased on an algorithm derived from the new Chinese remainder theorem I, we present three new residue-to-binary converters for the residue number system (2n-1, 2n, 2n+1) designed using 2n-bit or n-bit adders with improvements on speed, area, or dynamic range compared with various previous converters. The 2n-bit adder based converter is faster and requires about half the hardware required by previous methods. For n-bit adder-based implementations, one new converter is twice as fast as the previous method using a similar amount of hardware, whereas another new converter achieves improvement in either speed, area, or dynamic range compared with previous convertersYuke Wang, Xiaoyu Song, Mostapha Aboulhamid and Hong She

Calibration of shielded microwave probes using bulk dielectrics

A stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from the cantilever body and localizes the interaction only around the focused-ion beam deposited Pt tip. The approaching curve of an oscillating tip toward bulk dielectrics can be quantitatively simulated and fitted to the finite-element analysis result. The peak signal of the approaching curve is a measure of the sample dielectric constant and can be used to study unknown bulk materials.Comment: 10 pages, 3 figure

Symmetry of the Gap in Bi2212 from Photoemission Spectroscopy

In a recent Letter, Shen et al have detected a large anisotropy of the superconducting gap in Bi2212, consistent with d-wave symmetry, from photoemission spectroscopy. Moreover, they claim that the change in their spectra as a function of aging is also consistent with such an intrepretation. In this Comment, I show that the latter statement is not entirely correct, in that the data as a function of aging are inconsistent with a d-wave gap but are consistent with an anisotropic s-wave gap.Comment: 3 pages (Plain TeX with macros), plus 1 postscript figur

Modeling of a Cantilever-Based Near-Field Scanning Microwave Microscope

We present a detailed modeling and characterization of our scalable microwave nanoprobe, which is a micro-fabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis, the tip-sample interaction is modeled as small impedance changes between the tip electrode and the ground at our working frequencies near 1GHz. The equivalent lumped elements of the cantilever can be determined by transmission line simulation of the matching network, which routes the cantilever signals to 50 Ohm feed lines. In the microwave electronics, the background common-mode signal is cancelled before the amplifier stage so that high sensitivity (below 1 atto-Farad capacitance changes) is obtained. Experimental characterization of the microwave probes was performed on ion-implanted Si wafers and patterned semiconductor samples. Pure electrical or topographical signals can be realized using different reflection modes of the probe.Comment: 7 figure