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Quantitative Microanalysis with high Spatial Resolution: Application of FEG-DTEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steet
To assist in the characterization of microstructural changes associated with irradiation damage in low alloy steels, the technique of quantitative x-ray mapping using a field emission gun scanning transmission electron microscope (FEG-STEM) equipped with an x-ray energy Dispersive spectrometer (XEDS) has been employed. Quantitative XEDS microanalyses of the matrix and grain boundaries of irradiated specimens have been compared with previous quantitative analyses obtained using 3D-Atom Probe Field-Ion Microscopy (3D-APFIM). In addition, the FEG-STEM XEDS maps obtained from the irradiated steel have revealed the presence of 2 to 3 nm Ni-enriched 'precipitates' in the matrix, which had previously been detected using 3D-APFIM. These quantitative FEG-STEM XEDS results represent the first direct and independent microchemical corroboration of the 3D-APFIM results showing ultra-fine irradiation-induced hardening features in low alloy steel