Uncertainty Measures in Ordered Information System Based on Approximation Operators

This paper focuses on constructing uncertainty measures by the pure rough set approach in ordered information system. Four types of definitions of lower and upper approximations and corresponding uncertainty measurement concepts including accuracy, roughness, approximation quality, approximation accuracy, dependency degree, and importance degree are investigated. Theoretical analysis indicates that all the four types can be used to evaluate the uncertainty in ordered information system, especially that we find that the essence of the first type and the third type is the same. To interpret and help understand the approach, experiments about real-life data sets have been conducted to test the four types of uncertainty measures. From the results obtained, it can be shown that these uncertainty measures can surely measure the uncertainty in ordered information system

Hybrid-aligned nematic liquid-crystal modulators fabricated on VLSI circuits

A new method for fabricating analog light modulators on VLSI devices is described. The process is fully compatible with devices fabricated by commercial VLSI foundries, and the assembly of the modulator structures requires a small number of simple processing steps. The modulators are capable of analog amplitude or phase modulation and can operate at video rates and at low voltages (2.2 V). The modulation mechanism and the process yielding the modulator structures are described. Experimental data are presented