1 research outputs found
Characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy
With the advent of both modern X-ray fluorescence (XRF) methods and improved
analytical reliability requirements the demand for suitable reference samples
has increased. Especially in nanotechnology with the very low areal mass
depositions, quantification becomes considerably more difficult. However, the
availability of suited reference samples is drastically lower than the demand.
Physical vapor deposition (PVD) techniques have been enhanced significantly in
the last decade driven by the need for extremely precise film parameters in
multilayer production. We have applied those techniques for the development of
layer-like reference samples with mass depositions in the ng-range and well
below. Several types of reference samples were fabricated: multi-elemental
layer and extremely low (sub-monolayer) samples for various applications in XRF
and total-reflection XRF (TXRF) analysis. Those samples were characterized and
compared at three different synchrotron radiation beamlines at the BESSY II
electron storage ring employing the reference-free XRF approach based on
physically calibrated instrumentation. In addition, the homogeneity of the
multi-elemental coatings was checked at the P04 beamline at DESY. The
measurements demonstrate the high precision achieved in the manufacturing
process as well as the versatility of application fields for the presented
reference samples