25 research outputs found
Impression Creep Behavior of Sn-3.5Ag-0.7Cu/Cu Brazed
AbstractBrazing, as one of the major connection technology, has been widely used in different areas such as aviation, aerospace, electronics and chemical industries etc. Sometimes creep fracture can be found in the brazed joints when they are used at high temperature. The conventional characterized method for creep properties cannot be used to study the brazed joints due to their small size. The impression technology has the potential to be used to study the creep properties of brazed joints, since no special requirements are needed for the size and shape of to-be-measured materials. In this investigation, Sn-3.5Ag-0.7Cu/Cu brazed joint is created and its creep properties is measured by impression creep testing. The effect of punching stress and temperature is studied on the impressing depth, which change from 70 to 100MPa and 80-130 oC, respectively. The microstructure of Sn-3.5Ag-0.7Cu/Cu is examined by Optical Microscope (OM), Scanning Electron Microscope (SEM) and Energy Dispersive Spectra (EDS). The results show that the impressing creep depth increases with the rise of temperature and punching stress. Creep resistance of the diffusion region has obvious effect on the creep resistance of the weld. The experimental results can provide the basis for the structural integrity analysis of brazed joints
Pulsars as Fantastic Objects and Probes
Pulsars are fantastic objects, which show the extreme states of matters and
plasma physics not understood yet. Pulsars can be used as probes for the
detection of interstellar medium and even the gravitational waves. Here I
review the basic facts of pulsars which should attract students to choose
pulsar studies as their future projects.Comment: Invited Lecture on the "First Kodai-Trieste Workshop on Plasma
Astrophysics", Kodaikanal Obs, India. Aug.27-Sept.7th, 2007. In: "Turbulence,
Dynamos, Accretion Disks, Pulsars and Collective Plasma Processes". Get a
copy from: http://www.springerlink.com/content/978-1-4020-8867-