Noninvasive imaging of signals in digital circuits

In this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay images of these signals.We suggest that future developments of this technique may lead to real time, high resolution imaging of digital pulses across complex very large scale integrated circuits