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1 research outputs found
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults
Author
AB Yan
AH El-Maleh
+59Â more
Binyong He
BJ Liu
BJ Liu
Bo Li
D Cao
D Franco
D Franco
D Giot
D Kachave
D Rossi
F Brglez
F Wang
F Yu
Fei Yu
GI Zebrev
H Asadi
H Asadi
H Zandevakili
I Chatterjee
J Furuta
J Han
J Li
JD Black
KH Huang
KN Patel
L Naviner
Lairong Yin
M Anglada
M Ebrahimi
M Ebrahimi
M Fazeli
M Nicolaidis
M Raji
M Raji
M Zhang
MR Rohanipoor
MS Reorda
N Miskov-Zivanov
N Miskov-Zivanov
N Miskov-Zivanov
P Dodd
Peng Liu
R Rajaei
RR Rao
S Cai
S Cai
S Davidson
S Gangadhar
S Krishnaswamy
S Krishnaswamy
S Pagliarini
Shuo Cai
W Ibrahim
W Sootkaneung
Weizheng Wang
WZ Wang
XB Cao
Y Du
Y Qi
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
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