Casimir energy in spherical cavities

We calculate the Casimir energy at spherical cavities within a host made up of an arbitrary material described by a possibly dispersive and lossy dielectric response. To that end, we add to the coherent optical response a contribution that takes account of the incoherent radiation emitted by the host in order to guarantee the detailed balance required to keep the system at thermodynamic equilibrium in the presence of dissipation. The resulting boundary conditions allow a conventional quantum mechanical treatment of the radiation within the cavity from which we obtain the contribution of the cavity walls to the density of states, and from it, the thermodynamic properties of the system. The contribution of the cavity to the energy diverges as it incorporates the interaction energy between neighbor atoms in a continuum description. The change in the energy of an atom situated at the center of the cavity due to its interaction with the fluctuating cavity field is however finite. We evaluate the latter for a simple case.Comment: 9 pages, 4 figures, Proceedings of QFEXT07. To be published in J. Phys.

Surface Screening in the Casimir Force

We calculate the corrections to the Casimir force between two metals due to the spatial dispersion of their response functions. We employ model-independent expressions for the force in terms of the optical coefficients. We express the non-local corrections to the Fresnel coefficients employing the surface $d_\perp$ parameter, which accounts for the distribution of the surface screening charge. Within a self-consistent jellium calculation, spatial dispersion increases the Casimir force significatively for small separations. The nonlocal correction has the opposite sign than previously predicted employing hydrodynamic models and assuming abruptly terminated surfaces.Comment: 5 pages, 2 figure

Optical and electrical properties of nanostructured metallic electrical contacts

We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rsmax ≈ 2.7 Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicada