Features of the model of main information failures in digital CMOS VLSI at impact of the radiation

The methods of information security, which are based on the use of functional-logical modeling of very large digital integrated circuits (VLSI) under the influence of ionizing radiation are considered. It is shown that the multiplicity of the node and the power of the spectrum are more accurately described when using the concept of fuzzy multiplicity. Methods are proposed for predicting LSI failures when exposed to ionizing radiation, which are based on the model of fuzzy digital and probabilistic reliability automata. Moreover, the nature of their changes during irradiation depends on many factors, including the type of radiation, its intensity and range, type a criteria parameter characterizing the radiation resistance of ICs and work mode. Therefore, in different ranges of levels or intensities of the impact of the IC model can be either of fuzzy or probabilistic nature. Carrying out such a comparison is an essential step in the overall analysis of the IC radiation resistance

Using probabilistic fuzzy models for the prediction of functional failures of microwave LSI with radiation exposure

The article presents an analysis of microwave LSI behavior under radiation exposure at the functional-logical level of description. The analysis is based on fuzzy digital automaton and topological probabilistic models of workability assessment. It is shown that in certain cases both deterministic and non-deterministic failures are typical. Each operation threshold in logic elements under radiation influence has a zone of uncertainty and can be expressed quantitatively by a fuzzy number. This case, the real nature of microwave LSI radiation behavior is determined by the specific ratio of radiation-sensitive parameters of its elements and by taking into account the influence of their statistical scatter. Methods are proposed for simulating failures of microwave LSI under radiation exposure that are based on the model of a fuzzy digital Brauer automaton and a probabilistic reliability automaton

Functional-logic simulation of IP-blocks dose functional failures

The technique of functional-logical simulation of System-on-Chip (SoC) total dose radiation failures is presented based on fuzzy logic sets theory. An analysis of the capabilities of this approach for IP-blocks radiation behavior is carried out along with the analysis of operating modes under irradiation influence on IP-blocks radiation behavior. The following elements of this technique application for simulation of dose radiation failures of various types of IP-units are studied: logical elements, memory units and cells, processors. Examples of criterial membership functions and operability functions construction are given for these IP-units and for various critical parameters characterizing their failures. It is shown that when modeling total dose failures it is necessary to take into account the influence of the functional mode on the model parameters. The technique proposed allows improving the reliability of the SoC radiation hardness estimation, also for the purpose of solving the problems of information security of electronic devices

Experiment-Calculated Estimate of a LSIC Operation Reliability in order to Ensure Safety of Information under Radiation Influence

In this paper digital systems safety operation prediction methods under radiation influence, founded on Brower digital automate and a digital systems operation estimate topological probabilistic models, is considered

Usage of Probabilistic and Fuzzy Models for Prediction of Safety Digital Systems Operation under Radiation Influence

In the paper prediction is offered of safety digital systems operation under radiation influence methods, based on fuzzy Brouwer’s automatic and digital device operability estimating topological probabilistic models