56 research outputs found

    Multiscale mechanics of delamination in stretchable electronics

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    Electron micrographic digital image correlation : method optimization and microstructural banding case study

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    Segregation-induced microstructural banding is commonly encountered in commercial steels, yet its effect on the global mechanical behavior is disputed in the literature due to the difficulty of designing clean control experiments. This work locally compares the deformation of banded phases with unbanded regions in the same microstructure from in-situ electron micrographs analyzed with (optimized) micrographic digital image correlation. To this end, first, the employed electron micrographic digital image correlation (EMDIC) methodology is optimized in terms of its experimental parameters: specimen surface preparation settings, scanning electron microscopy imaging settings (contrast modes, magnification, resolution, and contrast-brightness), and image correlation settings (facet size and facet step size). Subsequently, the strength of the (optimized) EMDIC methodology is demonstrated on a case study on segregation-induced microstructural banding in steel, in which the influence of the banded phase and its morphology is probed by comparing the mechanical behavior of two carefully chosen, extreme cases of banded microstructures: a microstructure containing a continuous, hard band (the martensitic-ferritic system) and a microstructure containing non-continuous, softer bands (the pearlitic-ferritic system). The obtained micro-scale strain fields yield clear insight into the influence of band structure, morphology and band material properties

    Search for Lepton-Flavor-Violating tau Decays into a Lepton and a Vector Meson

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    We search for lepton-flavor-violating tau-> ell V^0 decays, where ell is an electron or muon and V^0 is one of the vector mesons rho^0, phi, omega, K*0 and K*0-bar. We use 854 fb^{-1} of data collected with the Belle detector at the KEKB asymmetric-energy e^+e^- collider. No evidence for a signal is found in any decay mode, and we obtain 90% confidence level upper limits on the individual branching fractions in the range (1.2-8.4)*10^{-8}.Comment: 13 pages, 5 figures, submitted to Phys. Lett.

    Study of B^{+-} -> K^{+-}(K_S K pi)^0 Decay and Determination of eta_c and eta_c(2S) Parameters

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    We report the results of a study of B±K±ηcB^{\pm}\to K^{\pm}\eta_c and B±K±ηc(2S)B^{\pm}\to K^{\pm}\eta_c(2S) decays followed by ηc\eta_c and ηc(2S)\eta_c(2S) decays to (KSKπ)0(K_SK\pi)^0. The results are obtained from a data sample containing 535 million BBˉB\bar{B}-meson pairs collected by the Belle experiment at the KEKB e+ee^+e^- collider. We measure the products of the branching fractions B(B±K±ηc)B(ηcKSK±π)=(26.7±1.4(stat)2.6+2.9(syst)±4.9(model))×106{\mathcal B}(B^{\pm}\to K^{\pm}\eta_c){\mathcal B}(\eta_c\to K_S K^{\pm}\pi^{\mp})=(26.7\pm 1.4(stat)^{+2.9}_{-2.6}(syst)\pm 4.9(model))\times 10^{-6} and B(B±K±ηc(2S))B(ηc(2S)KSK±π)=(3.41.5+2.2(stat+model)0.4+0.5syst))×106{\mathcal B}(B^{\pm}\to K^{\pm}\eta_c(2S)){\mathcal B}(\eta_c(2S)\to K_S K^{\pm}\pi^{\mp})=(3.4^{+2.2}_{-1.5}(stat+model)^{+0.5}_{-0.4} syst))\times 10^{-6}. Interference with the non-resonant component leads to significant model uncertainty in the measurement of these product branching fractions. Our analysis accounts for this interference and allows the model uncertainty to be reduced. We also obtain the following charmonia masses and widths: M(ηc)=(2985.4±1.5(stat)2.0+0.5(syst))M(\eta_c)=(2985.4\pm 1.5(stat)^{+0.5}_{-2.0}(syst)) MeV/c2c^2, Γ(ηc)=(35.1±3.1(stat)1.6+1.0(syst))\Gamma(\eta_c)=(35.1\pm 3.1(stat)^{+1.0}_{-1.6}(syst)) MeV/c2c^2, M(ηc(2S))=(3636.14.2+3.9(stat+model)2.0+0.7(syst))M(\eta_c(2S))=(3636.1^{+3.9}_{-4.2}(stat+model)^{+0.7}_{-2.0}(syst)) MeV/c2c^2, Γ(ηc(2S))=(6.65.1+8.4(stat+model)0.9+2.6(syst))\Gamma(\eta_c(2S))=(6.6^{+8.4}_{-5.1}(stat+model)^{+2.6}_{-0.9}(syst)) MeV/c2c^2.Comment: 23 pages, 10 figures, submitted to PL

    Measurement of time-dependent CP violation in B-0 - eta \u27 K-0 decays

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    The Physics of the B Factories

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    Multiscale mechanics of delamination in stretchable electronics

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    Multi-scale analysis of cohesive interfaces

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