High-sensitivity and high-resolution low-energy ion scattering

Low-Energy Ion Scattering (LEIS or ISS) is used to selectively analyze the atomic composition of the outer atomic layer of surfaces. In addition, the spectrum gives (non-destructively) the in-depth distribution. Using a double toroidal energy analyzer with parallel energy detection and time-of-flight filtering a high sensitivity and mass resolution of LEIS is achieved. This is demonstrated for a highly dispersed catalyst of Pt/Au on ¿-alumina. The improved depth resolution is illustrated for self-assembled monolayers of alkanethiols (12–20 carbon atoms) on gold. Even for these low Z carbon atoms a clear shift of 8 eV/carbon atom is observed (using 1.5 keV 4He+ ion scattering). This opens many new possibilities for studies of ultra-thin diffusion barriers, high-k dielectrics and biosensors

High-sensitivity and high-resolution low-energy ion scattering

Low-Energy Ion Scattering (LEIS or ISS) is used to selectively analyze the atomic composition of the outer atomic layer of surfaces. In addition, the spectrum gives (non-destructively) the in-depth distribution. Using a double toroidal energy analyzer with parallel energy detection and time-of-flight filtering a high sensitivity and mass resolution of LEIS is achieved. This is demonstrated for a highly dispersed catalyst of Pt/Au on ¿-alumina. The improved depth resolution is illustrated for self-assembled monolayers of alkanethiols (12–20 carbon atoms) on gold. Even for these low Z carbon atoms a clear shift of 8 eV/carbon atom is observed (using 1.5 keV 4He+ ion scattering). This opens many new possibilities for studies of ultra-thin diffusion barriers, high-k dielectrics and biosensors