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2 research outputs found
Short-Circuit Degradation of 10-kV 10-A SiC MOSFET
Author
Beczkowski Szymon
Eni Emanuel-Petre
+10Â more
Grider David
Hull Brett
Julsgaard Brian
Juluri Raghavendra Rao
Kerekes Tamas
Munk-Nielsen Stig
Sabri Shadi
Teodorescu Remus
Uhrenfeldt Christian
VanBrunt Edward
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
01/12/2017
Field of study
No full text
Crossref
VBN
Short-Circuit Degradation of 10-kV 10-A SiC MOSFET
Author
Brett Hull
Brian Julsgaard
+10Â more
Christian Uhrenfeldt
David Grider
Edward VanBrunt
Emanuel-Petre Eni
Raghavendra Rao Juluri
Remus Teodorescu
Shadi Sabri
Stig Munk-Nielsen
Szymon Beczkowski
Tamas Kerekes
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study
No full text
Crossref