10 research outputs found

    Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage

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    Reducing SoC Test Time and Test Power in Hierarchical Scan Test : Scan Architecture and Algorithms

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    A framework for concurrency control in real-time distributed collaboration for mobile systems

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    A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test

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    A framework for distributed and hierarchical design-for-test

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